Reference number
ISO 9220:1988
ISO 9220:1988
Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
Edition 1
1988-10
Retirada
ISO 9220:1988
16849
Retirada (Edición 1, 1988)

Resumen

Specifies a method for the measurement of the local thickness of metallic coatings by examination of cross-section with a scanning electron microscope. It is destructive and has an uncertainty of less than 10 % or 0,1 /um, whichever is greater. It can be used for thicknesses up to several millimetres, but it is usually more practical to use a ligth microscope (ISO 1463). Annex a gives the preparation of cross-sections.

Informaciones generales

  •  : Retirada
     : 1988-10
    : Retirada de la Norma Internacional [95.99]
  •  : 1
     : 5
  • ISO/TC 107
    25.220.40 
  • RSS actualizaciones

Ciclo de vida

¿Tiene alguna duda?

Consulte nuestras Ayuda y asistencia