International Standard
ISO 16526-1:2011
Non-destructive testing — Measurement and evaluation of the X-ray tube voltage — Part 1: Voltage divider method
Reference number
ISO 16526-1:2011
Edición 1
2011-12
International Standard
Vista previa
ISO 16526-1:2011
57042
No disponible en español
Publicado (Edición 1, 2011)
Esta norma se revisó y confirmó por última vez en 2021. Por lo tanto, esta versión es la actual.

ISO 16526-1:2011

ISO 16526-1:2011
57042
Idioma
Formato
CHF 42
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Resumen

ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system.

This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.

Informaciones generales

  •  : Publicado
     : 2011-12
    : Norma Internacional confirmada [90.93]
  •  : 1
     : 2
  • ISO/TC 135/SC 5
    19.100 
  • RSS actualizaciones

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