International Standard
ISO 19830:2015
Surface chemical analysis — Electron spectroscopies — Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Reference number
ISO 19830:2015
ISO 19830:2015
Edición 1
2015-11
2015-11
© ISO 2024
International Standard
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ISO 19830:2015
66294
No disponible en español
Publicado
(Edición 1, 2015)
Esta norma se revisó y confirmó por última vez en 2021.
Por lo tanto, esta versión es la actual.
Resumen
ISO 19830:2015 Standard is to define how peak fitting and the results of peak fitting in X-ray photoelectron spectroscopy shall be reported. It is applicable to the fitting of a single spectrum or to a set of related spectra, as might be acquired, for example, during a depth profile measurement. This International Standard provides a list of those parameters which shall be reported if either reproducible peak fitting is to be achieved or a number of spectra are to be fitted and the fitted spectra compared. This International Standard does not provide instructions for peak fitting nor the procedures which should be adopted.
Informaciones generales
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Estado: PublicadoFecha de publicación: 2015-11Etapa: Norma Internacional confirmada [90.93]
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Edición: 1Número de páginas: 22
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Comité Técnico :ISO/TC 201/SC 7ICS :71.040.40
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