ISO/DIS 20263
u
ISO/DIS 20263
87682
No disponible en español

Estado : En desarrollo

es
Formato Idioma
std 1 63 PDF
std 2 63 Papel
  • CHF63
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Resumen

ISO 20263:2017 specifies a procedure for the determination of averaged interface position between two different layered materials recorded in the cross-sectional image of the multi-layered materials. It is not intended to determine the simulated interface of the multi-layered materials expected through the multi-slice simulation (MSS) method. This document is applicable to the cross-sectional images of the multi-layered materials recorded by using a transmission electron microscope (TEM) or a scanning transmission electron microscope (STEM) and the cross-sectional elemental mapping images by using an energy dispersive X-ray spectrometer (EDS) or an electron energy loss spectrometer (EELS). This document is also applicable to the digitized image recorded on an image sensor built into a digital camera, a digital memory set in the PC or an imaging plate and the digitalized image converted from an analogue image recorded on the photographic film by an image scanner.

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Informaciones generales

  •  : En desarrollo
    Puede contribuir al desarrollo del borrador de esta norma internacional. Para ello, contacte con su miembro nacional
    : Voto sobre el DIS iniciado: 12 semanas [40.20]
  •  : 2
     : 48
  • ISO/TC 202/SC 3
    37.020  71.040.50 
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