Reference number
ISO/TS 10867:2019
Technical Specification
ISO/TS 10867:2019
Nanotechnologies — Characterization of single-wall carbon nanotubes using near infrared photoluminescence spectroscopy
Edition 2
2019-12
Technical Specification
Read sample
ISO/TS 10867:2019
75336
Published (Edition 2, 2019)
This publication was last reviewed and confirmed in 2023. Therefore this version remains current.

ISO/TS 10867:2019

ISO/TS 10867:2019
75336
Language
Format
CHF 96
Convert Swiss francs (CHF) to your currency

Abstract

This document gives guidelines for the characterization of single-wall carbon nanotubes (SWCNTs) using near infrared (NIR) photoluminescence (PL) spectroscopy.

It provides a measurement method for the determination of the chiral indices of the semi-conducting SWCNTs in a sample and their relative integrated PL intensities.

The method can be expanded to estimate the relative mass concentrations of semi-conducting SWCNTs in a sample from their measured integrated PL intensities and knowledge of their PL cross-sections.

General information

  •  : Published
     : 2019-12
    : International Standard confirmed [90.93]
  •  : 2
     : 17
  • ISO/TC 229
    07.120 
  • RSS updates

Got a question?

Check out our Help and Support