ISO 21222:2020

Status : Published

	Format	Language
std 1 92	PDF
std 2 92	Paper

CHF92

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Abstract

This document describes a procedure for the determination of elastic modulus for compliant materials using atomic force microscope (AFM). Force-distance curves on the surface of compliant materials are measured and the analysis uses a two-point method based on Johnson-Kendall-Roberts (JKR) theory. This document is applicable to compliant materials with elastic moduli ranging from 100 kPa to 1 GPa. The spatial resolution is dependent on the contact radius between the AFM probe and the surface and is typically approximately10-20 nm.

General information

Status
: Published

Publication date
: 2020-01

Stage
: International Standard published [60.60]
Edition
: 1

Number of pages
: 17
Technical Committee :
ISO/TC 201/SC 9

ICS :
71.040.40
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