ISO 23729:2022
p
ISO 23729:2022
79844

Status : Published

en
Format Language
std 1 96 PDF + ePub
std 2 96 Paper
  • CHF96
Convert Swiss francs (CHF) to your currency

Abstract

This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size. The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials. This document is applicable to the reconstruction of AFM topography images of solid material surfaces.

Read sample 

Preview this standard in our Online Browsing Platform (OBP)

General information

  •  : Published
     : 2022-07
    : International Standard published [60.60]
  •  : 1
     : 15
  • ISO/TC 201/SC 9
    71.040.40 
  • RSS updates

Got a question?

Check out our FAQs

Customer care
+41 22 749 08 88

Opening hours:
Monday to Friday - 09:00-12:00, 14:00-17:00 (UTC+1)