International Standard
ISO 24173:2024
Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
Reference number
ISO 24173:2024
Edition 2
2024-02
© ISO 2024
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Published (Edition 2, 2024)

ISO 24173:2024

Language
Format
CHF 173
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Abstract

This document gives guidance on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.

General information

  • Status
     : Published
    Publication date
     : 2024-02
    Stage
    : International Standard published [60.60]
  • Edition
     : 2
    Number of pages
     : 40
  • Technical Committee :
    ISO/TC 202
    ICS :
    71.040.50 
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goal

9
Industry, Innovation and Infrastructure

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