Abstract
This document describes the influence quantities and instrument characteristics of confocal microscopy systems for areal measurement of surface topography. Because surface profiles can be extracted from surface topography images, the methods described in this document can be applied to profiling measurements as well.
General information
-
Status: PublishedPublication date: 2019-03Stage: International Standard to be revised [90.92]
-
Edition: 1Number of pages: 21
-
Technical Committee :ISO/TC 213ICS :17.040.20
- RSS updates
Life cycle
-
Now
-
Will be replaced by
Under developmentISO/AWI 25178-607