Status : Under development

Abstract

This document uses ellipsometric measurements and their analysis to specify the method for the determination of the layer thickness d of a transparent layer and the optical (refractive index n) or dielectric (real part ε1) constants/functions based on the transparent single layer model within a spectral region, for which k = 0 applies.

General information

  • Status
     : Under development
    Stage
    : New project registered in TC/SC work programme [20.00]
  • Edition
     : 1
  • Technical Committee :
    ISO/TC 107
  • RSS updates

Life cycle

Sustainable Development Goals

This standard contributes to the following Sustainable Development Goals

1
No Poverty
3
Good Health and Well-being
6
Clean Water and Sanitation
7
Affordable and Clean Energy
8
Decent Work and Economic Growth
9
Industry, Innovation and Infrastructure
11
Sustainable Cities and Communities
12
Responsible Consumption and Production
13
Climate Action

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